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Volumn 410, Issue 1-2, 2002, Pages 107-113

Comparative analysis for the crystalline and ferroelectric properties of Pb(Zr,Ti)O3 thin films deposited on metallic LaNiO3 and Pt electrodes

(8) Chae, B G a Yang, Y S a Lee, S H a Jang, M S a Lee, S J b Kim, S H b Baek, W S c Kwon, S C c

a Pusan National University (South Korea)

b Electronics and Telecommunications Research Institute (ETRI) (South Korea)

c Korea Institute of Machine and Materials (South Korea)

Author keywords

Crystallisation; Ferroelectric properties; Polarization fatigue; Sputtering

Indexed keywords

CRYSTAL DEFECTS; ELECTROCHEMICAL ELECTRODES; GRAIN SIZE AND SHAPE; HYSTERESIS; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; MAGNETRON SPUTTERING; NONVOLATILE STORAGE; PERMITTIVITY; POLARIZATION; POLYCRYSTALLINE MATERIALS;

POLARIZATION FATIGUE;

FERROELECTRIC THIN FILMS;

EID: 0036574312 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(02)00254-7 Document Type: Article

Times cited : (92)

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