Preparation of highly (1 0 0)-oriented LaNiO3 nanocrystalline films by metalorganic chemical liquid deposition

Journal of Crystal Growth

Volumn 277, Issue 1-4, 2005, Pages 450-456

  Wang, G S ^a,b   Zhao, Q ^a   Meng, X J ^a   Chu, J H ^a   Remiens D ^b  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b INSTITUT D ELECTRONIQUE   (France)

Author keywords

A1. X ray diffraction; B1. Perovskite; B2. Oxide superconducting materials

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; HYSTERESIS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; OXIDE SUPERCONDUCTORS; PEROVSKITE; PYROLYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; METALORGANIC CHEMICAL LIQUID DEPOSITION (MOCLD); NANOCRYSTALLINE FILMS; OXIDE SUPERCONDUCTING MATERIALS;

LANTHANUM COMPOUNDS;

EID: 15844373350     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.01.099     Document Type: Article

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