Preparation and properties of conductive LaNiO3 thin films by a thermal decomposition of water-based solutions

Thin Solid Films

Volumn 311, Issue 1-2, 1997, Pages 128-132

  Ling, Yun ^a   Ren, Wei ^a   Wu, Xiao Qing ^a   Zhang, Liang Ying ^a   Yao, Xi ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Conductivity; Deposition process; Electrical properties and measurements; X ray diffraction

Indexed keywords

ADDITIVES; ANNEALING; COMPOSITION; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM PREPARATION; LANTHANUM COMPOUNDS; MORPHOLOGY; PYROLYSIS; SOLVENTS; WATER; X RAY DIFFRACTION ANALYSIS;

GLYCINE; LANTHANUM NICKEL OXIDE; ROOM TEMPERATURE RESISTIVITY; WATER BASED SOLUTION;

CONDUCTIVE FILMS;

EID: 0031358810     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00445-8     Document Type: Article

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