Ferroelectric properties of SrRu O3 BaTi O3 SrRu O3 ultrathin film capacitors free from passive layers

Applied Physics Letters

Volumn 88, Issue 7, 2006, Pages

  Kim, Y S ^a   Jo, J Y ^a   Kim, D J ^a   Chang, Y J ^a   Lee, J H ^a   Noh, T W ^a   Song, T K ^b   Yoon, J G ^c   Chung, J S ^d   Baik, S I ^a   Kim, Y W ^a   Jung, C U ^e  

^a Seoul National University   (South Korea)

^b Changwon National University   (South Korea)

^c Suwon University   (South Korea)

^d Soongsil University   (South Korea)

^e Hankuk University of Foreign Studies   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE ENDURANCE; SRRU O3 BATI O3 SRRU O3 THIN FILMS; ULTRATHIN FILM CAPACITORS;

CAPACITORS; DURABILITY; FERROELECTRICITY; INTERFACES (MATERIALS); STRONTIUM COMPOUNDS; THIN FILM DEVICES;

ULTRATHIN FILMS;

EID: 32944473983     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2174100     Document Type: Article

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