Preparation and conducting performance of LaNiO3 thin film on Si substrate

Thin Solid Films

Volumn 471, Issue 1-2, 2005, Pages 48-52

  Zhu, Yongfa ^a   Wang, Hai ^a   Liu, Peng ^a   Yao, Wenqing ^a   Cao, Lili ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

AES; LaNiO3; Resistivity; SEM

Indexed keywords

ADDITION REACTIONS; AMORPHOUS MATERIALS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CALCINATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; PEROVSKITE; POLYETHYLENE GLYCOLS; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

AES; CYLINDRICAL MIRROR ANALYZERS (CMA); DEPTH PROFILE ANALYSIS; LANIO3;

THIN FILMS;

EID: 10644257615     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.04.023     Document Type: Article

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