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Volumn 479, Issue 1-2, 2009, Pages 348-351

Nanoindentation on a-plane ZnO thin films

Author keywords

AFM; Hardness; Nanoindentation; XRD; ZnO

Indexed keywords

A PLANES; AFM; ATOMIC-FORCE MICROSCOPIES; DEPOSITION TEMPERATURES; EXPERIMENTAL DATUM; GRAIN SIZES; HALL-PETCH; HALL-PETCH EQUATIONS; LATTICE FRICTIONS; LOAD-DISPLACEMENT CURVES; NANO-INDENTATION TECHNIQUES; PLANE SAPPHIRES; RADIO-FREQUENCY SPUTTERING; STRUCTURAL AND MECHANICAL PROPERTIES; X-RAY DIFFRACTIONS; XRD; XRD ANALYSIS; YOUNG'S MODULUS; ZNO; ZNO THIN FILMS;

EID: 67349189441     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.12.073     Document Type: Article
Times cited : (24)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.