Evaluating the effectiveness of physically-aware N-Detect test using real silicon

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Lin, Yen Tzu ^a   Poku, Osei ^a   Blanton, R D ^a   Nigh, Phil ^b   Lloyd, Peter ^b   Iyengar, Vikram ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTICS OF DEFECT; DELAY TESTS; DETECTION CHARACTERISTICS; INDUSTRIAL DESIGN; LOGIC BIST; LSI CHIPS;

TESTING;

EID: 67249104877     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700606     Document Type: Conference Paper

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