Achieving serendipitous N-detect mark-Off s in multi-capture-clock scan patterns

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Bhargava, Gaurav ^a   Meehl, Dale ^b   Sage, James ^b  

^a QUALCOMM INC   (United States)

^b CADENCE DESIGN SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; MATHEMATICAL MODELS;

MULTI-CAPTURE-CLOCK SCAN PATTERNS; TEST PATTERNS;

STACKING FAULTS;

EID: 39749191381     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437648     Document Type: Conference Paper

References (5)