Physically-aware N-detect test pattern selection

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 634-639

  Lin, Yen Tzu ^a   Poku, Osei ^a   Bhatti, Naresh K ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL TESTING; LOGICAL STATES; N-DETECT; PATTERN SELECTION; SIGNAL LINES; TEST PATTERNS; TEST SELECTION; TEST SETS;

INDUSTRIAL ENGINEERING;

TESTING;

EID: 49749097137     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484748     Document Type: Conference Paper

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