Evaluation of the quality of N-detect scan ATPG patterns on a processor

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 669-678

  Amyeen, M Enamul ^a   Venkataraman, Srikanth ^a   Ojha, Ajay ^a   Lee, Sangbong ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; PRODUCT QUALITY; SIGNAL STATES; TEST PATTERNS; TEST QUALITY;

AUTOMATION; BUILT-IN SELF TEST; COMPUTER SIMULATION; COMPUTER SYSTEMS PROGRAMMING; COST EFFECTIVENESS; MICROPROCESSOR CHIPS; PATTERN RECOGNITION; PRODUCT DESIGN;

PROGRAM PROCESSORS;

EID: 18144425772     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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