SCOPUS 정보 검색 플랫폼

IEEE Transactions on Computers

Volumn 53, Issue 11, 2004, Pages 1497-1503

A measure of quality for n-detection test sets

(2) Pomeranz, Irith a Reddy, Sudhakar M b

a PURDUE UNIVERSITY (United States)

b UNIVERSITY OF IOWA (United States)

Author keywords

N detection tests; Test set ordering; Unmodeled faults

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SET THEORY; STATISTICAL TESTS;

BENCHMARK CIRCUIT; DEFECTIVE CHIPS; DETECTION TESTS; SET ORDERING; UNMODELED FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 8744236029 PISSN: 00189340 EISSN: None Source Type: Journal
DOI: 10.1109/TC.2004.87 Document Type: Article

Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.