Embedded multi-detect ATPG and its effect on the detection of unmodeled defects

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Geuzebroek, Jeroen ^a   Marinissen, Erik Jan ^a   Majhi, Ananta ^a   Glowatz, Andreas ^b   Hapke, Friedrich ^b  

^a NXP SEMICONDUCTORS   (Netherlands)

^b NXP SEMICONDUCTORS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; QUALITY CONTROL;

MULTI-DETECT TESTS; UNMODELED DEFECTS;

EMBEDDED SYSTEMS;

EID: 39749093844     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437649     Document Type: Conference Paper

References (20)