Defect aware test patterns

Proceedings -Design, Automation and Test in Europe, DATE '05

Volumn I, Issue , 2005, Pages 450-455

  Tang, Huaxing ^a   Chen, Gang ^a   Reddy, Sudhakar M ^a   Wang, Chen ^b   Rajski, Janusz ^b   Pomeranz, Irith ^c  

^a UNIVERSITY OF IOWA   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL DESIGNS; TEST PATTERNS; UN-MODELED DEFECTS;

DEFECTS; INDUSTRIAL APPLICATIONS; MATHEMATICAL MODELS; PRODUCT DEVELOPMENT;

AUTOMATIC TESTING;

EID: 33646920103     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.110     Document Type: Conference Paper

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