A study of outlier analysis techniques for delay testing

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Wu, Sean H ^a   Drmanac, Dragoljub ^a   Wang, Li C ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEST MODEL; DELAY DEFECTS; DELAY TESTING; DISTANCE BASED ALGORITHM; EUCLIDEAN; ONE CLASS-SVM; ONE-CLASS SUPPORT VECTOR MACHINE; OUTLIER ANALYSIS; POLYNOMIAL KERNELS; RANDOM FORESTS;

SUPPORT VECTOR MACHINES;

EID: 67249091692     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700548     Document Type: Conference Paper

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