Outlier Detection for DPPM Reduction

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 818-827

  Buxton, Paul ^a   Tabor, Paul ^b  

^a Test Advantage Ltd   (United Kingdom)

^b Test Advantage Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURE; SEMICONDUCTOR MATERIALS; STRESS ANALYSIS;

OUTLIER DETECTION;

QUALITY CONTROL;

EID: 0142153689     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. A. Edgar "Measurement and Test", Napier University; School of Engineering, Module No: EE71022. 1999.
2. QS9000 Quality Systems for Automotive Component Suppliers.
3. D. C. Montgomery, "Introduction to Statistical Quality Control", WILEY
4. ddQ Testing 1996, Washington D.C. October 1996 pp. 14-17.
5. R. High "Dealing With Outliers", University of Oregon Computing News, Issue: Spring 2000
6. AEC "Guidelines for Part Average Testing", AEC-Q001 Rev B
7. ddQ Testing for Burn-in Reduction", IEEE VLSI Test Symposium, April 2002.
8. B. Iglewicz, D. Hoaglin, "How to Detect and Handle Outliers", The ASQC Basic References in Quality Control: Statistical Techniques, Vol 16, ASQC, 1993, pp 10-13.