Data-driven models for statistical testing: Measurements, estimates and residuals

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 313-322

  Daasch, W Robert ^a   Madge, Robert ^b  

^a Portland State University   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA-DRIVEN MODEL; DEEP-SUBMICRON SEMICONDUCTOR; HEALTHY RESPONSE;

COMPUTATION THEORY; PARAMETER ESTIMATION; SEMICONDUCTOR MATERIALS; STATISTICAL TESTS;

MATHEMATICAL MODELS;

EID: 33847152063     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583989     Document Type: Conference Paper

References (13)

1. R. Daasch and R. Madge, "Variance Reduction and Outliers: Statistical Analysis of Semiconductor Test Data," Proceedings of the International Test Conference, 2005.
2. P. Maxwell, P. ONeill, R. Aitken, R. Dudley, N. Jaarsma, M. Quach, and D. Wiseman, "Current ratios: A Self-Scaling Technique for Production IDDQ Testing," Proceedings International Test Conference, pp. 738-746, Oct 1999.
3. P. Nigh and A. Gattiker, "Test Method Evaluation Experiments and Data," Proceedings International Test Conference, pp. 199-206, Oct 2000.
4. A. Keshvarazi, K. Roy, and C. Hawkins, "Intrinsic Leakage in Low Power Deep Submicron CMOS ICs," Proceedings International Test Conference, pp. 146-155, November 1997.
5. DDQ Data," Proceedings of International Test Conference, pp. 189-198, October 2000.
6. DDQ and Other Parametric Data," IEEE International Test Conference, pp. 92-100, October 2001.
7. W.R. Daasch, "Parametric Variation or Defects? Statistical Post-Processing Analysis of Wafer-Sort Data," International Symposium for Testing and Failure Analysis, pp. 302-307, Nov 2002.
8. DDQ and Other Parametric Data," IEEE International Test Conference, pp. 92-100, October 2001.
9. C. Schuermyer, B. Benware, K. Cota, R. Madge, and R. Daasch, "Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ," International Test Conference, 2004.
10. R. Madge, B. Goh, V. Rajagopalan, C. Macchietto, R. Daasch, C. Schuermyer, C. Taylor, and D. Turner, "Screening MinVDD Outliers Using Feed-Forward Voltage Testing," Proceedings IEEE International Test Conference, p. 673, October 2002.
11. R. Turakhia, B. Benware, R. Madge, T. Shannon, and R. Daasch, "Defect screening using independent component analysis on IDDQ," Proceedings VLSI Test Symposium, pp. 427-432, May, 2005.
12. C. Thibeault, "Replacing IDDQ Testing: With Variance Reduction," Journal of Electronic Testing: Theory and Applications, 19, pp. 325-340, 2003.
13. T.J. Powell, J. Pair, M. S. John, and D. Council, "Delta IDDQ for Testing Reliability," Proceedings VLSI Test Symposium, pp. 439-443, April 2000.