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Volumn , Issue , 2007, Pages
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Measurement ratio testing for improved quality and outlier detection
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROFABRICATION;
PRODUCTION;
QUALITY CONTROL;
LOT TEST TIME;
MEASUREMENT RATIO TESTING;
TEST OUTLIERS;
INTEGRATED CIRCUIT LAYOUT;
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EID: 39749100674
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.2007.4437616 Document Type: Conference Paper |
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Times cited : (7)
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References (15)
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