Issues on test optimization with known good dies and known defective dies -A statistical perspective

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Lee, Benjamin N ^a   Wang, Li C ^a   Abadir, Magdy S ^b  

^a University of California

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEARNING SYSTEMS; OPTIMIZATION; SEMICONDUCTING SILICON; STATISTICAL METHODS; TIMING CIRCUITS;

DATA LEARNING; SILICON SAMPLES; TEST OPTIMIZATION; TIMING BOUNDARY;

OPTICAL TESTING;

EID: 39749179751     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297640     Document Type: Conference Paper

References (28)