Burn-in reduction using principal component analysis

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 146-155

  Nahar, Amit ^a   Daasch, Robert ^a   Subramaniam, Suresh ^b  

^a PORTLAND STATE UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BURN-IN REDUCTION SCREEN; DIE PASSING;

DATA REDUCTION; RELIABILITY; SILICON WAFERS; SORTING;

PRINCIPAL COMPONENT ANALYSIS;

EID: 33847109705     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583971     Document Type: Conference Paper

References (10)

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