Variance reduction and outliers: Statistical analysis of semiconductor test data

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 304-312

  Daasch, W Robert ^a   Madge, Robert ^b  

^a Portland State University   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP-SUBMICRON SEMICONDUCTOR; DEFECT-FREE; OUTLIER DETECTION; OUTLIER SCREENING;

DATA REDUCTION; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SEMICONDUCTOR MATERIALS;

STATISTICAL METHODS;

EID: 33847163524     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583988     Document Type: Conference Paper

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