Frequency shift imaging of quantum dots with single-electron resolution

Applied Physics Letters

Volumn 87, Issue 24, 2005, Pages 1-3

  Zhu, J ^a   Brink, M ^a   McEuen, P L ^a  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGING ENERGY; FREQUENCY SHIFT IMAGING;

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRONIC PROPERTIES; ELECTRONS; FREQUENCY SHIFT KEYING; IMAGING TECHNIQUES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 28844459003     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2139623     Document Type: Article

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