Improving lateral resolution of electrostatic force microscopy by multifrequency method under ambient conditions

Applied Physics Letters

Volumn 94, Issue 22, 2009, Pages

  Ding, X D ^a,b   An, J ^b   Xu, J B ^b   Li, C ^a   Zeng, R Y ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; EIGEN MODES; ELECTROSTATIC FORCE MICROSCOPY; LATERAL RESOLUTION; MULTI FREQUENCY; MULTIFREQUENCY METHOD; SCANNING PROBE TECHNIQUES; SINUSOIDAL MODULATION; SPATIAL RESOLUTION; THEORETICAL EXPLANATION; TOPOGRAPHIC IMAGING; TWO-DIMENSIONAL IMAGES;

ATOMIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; MODULATION; NANOCANTILEVERS;

ELECTROSTATIC FORCE;

EID: 66749115985     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3147198     Document Type: Article

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