Bimodal magnetic force microscopy: Separation of short and long range forces

Applied Physics Letters

Volumn 94, Issue 16, 2009, Pages

  Li, Jason W ^a   Cleveland, Jason P ^a   Proksch, Roger ^a  

^a United States   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST MECHANISMS; LONG RANGES; LONG-RANGE FORCES; MAGNETIC FORCES; SIGNAL-TO-NOISE RATIOS; SINGLE PASS; SPATIAL RESOLUTIONS; THEORETICAL PREDICTIONS;

ATOMIC FORCE MICROSCOPY; ATOMS; IMAGING TECHNIQUES; MAGNETIC FORCE MICROSCOPY; SIGNAL TO NOISE RATIO; SURFACE ROUGHNESS;

MAGNETISM;

EID: 65449178814     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3126521     Document Type: Article

References (20)

1. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 0031-9007 56, 930 (1986). 10.1103/PhysRevLett.56.930
2. E. Meyer, H. Heinzelmann, P. Grütter, T. Jung, H. R. Hidber, H. Rudin, and H. J. Güntherodt, Thin Solid Films 0040-6090 181, 527 (1989). 10.1016/0040-6090(89)90522-1
3. L. Weisenhorn, P. K. Hansma, T. R. Albrecht, and C. F. Quate, Appl. Phys. Lett. 0003-6951 54, 2651 (1989). 10.1063/1.101024
4. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 0021-8979 61, 4723 (1987). 10.1063/1.338807
5. S. Hosaka, A. Kikukawa, Y. Honda, H. Koyanagi, and S. Tanaka, Jpn. J. Appl. Phys., Part 1 0021-4922 31, L904 (1992).
6. D. W. Abraham, C. Williams, J. Slinkman, and H. K. Wickramasinghe, J. Vac. Sci. Technol. B 1071-1023 9, 703 (1991). 10.1116/1.585536
7. D. Ziegler, J. Rychen, N. Naujoks, and A. Stemmer, Nanotechnology 0957-4484 18, 225505 (2007). 10.1088/0957-4484/18/22/225505
8. R. W. Stark, N. Naujoks, and A. Stemmer, Nanotechnology 0957-4484 18, 065502 (2007). 10.1088/0957-4484/18/6/065502
9. S. Jesse, S. V. Kailin, R. Proksch, A. P. Baddorf, and B. J. Rodriguez, Nanotechnology 0957-4484 18, 435503 (2007). 10.1088/0957-4484/18/43/435503
10. A. San Paulo, J. P. Black, R. M. White, and J. Bokor, Appl. Phys. Lett. 0003-6951 91, 053116 (2007). 10.1063/1.2767764
11. P. Thota, S. MacLaren, and H. Dankowicz, Appl. Phys. Lett. 0003-6951 91, 093108 (2007). 10.1063/1.2775031
12. S. Basak and A. Raman, Appl. Phys. Lett. 0003-6951 91, 064107 (2007). 10.1063/1.2760175
13. S. Patil, N. F. Martinez, J. R. Lozano, and R. Garcia, J. Mol. Recognit. 0952-3499 20, 516 (2007). 10.1002/jmr.848
14. T. R. Rodriguez and R. Garcia, Appl. Phys. Lett. 0003-6951 84, 449 (2004). 10.1063/1.1642273
15. R. Proksch, Appl. Phys. Lett. 0003-6951 89, 113121 (2006). 10.1063/1.2345593
16. N. F. Martinez, S. Patil, J. R. Lozano, and R. Garcia, Appl. Phys. Lett. 0003-6951 89, 153115 (2006). 10.1063/1.2360894
17. J. Israelachvili, Intermolecular and Surface Forces, 2nd ed. (Academic, New York, 1991), p 6.
18. MFP-3D, Asylum Research, Santa Barbara, CA.
19. ASYMFM, 240 μm long silicon cantilever with 50 nm coating CoCr, Asylum Research.
20. D. Sarid, Scanning Force Microscopy: with Applications to Electric, Magnetic, and Atomic Forces (Oxford University Press, New York, 1994).