Detecting electrical forces in noncontact atomic force microscopy

Measurement Science and Technology

Volumn 9, Issue 5, 1998, Pages 734-738

  Muller F ^a   Muller A D ^a   Hietschold, M ^a   Kammer S ^b  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b TopoMetrix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRODES; FREQUENCY MODULATION; GLASS; IMAGING TECHNIQUES; SUBSTRATES;

ELECTRICAL MODULATION; KELVIN FEEDBACK; MECHANICAL CANTILEVER MODULATION FREQUENCY; SCANNING ELECTRICAL FORCE MICROSCOPE; SURFACE POTENTIAL DISTRIBUTIONS; TIP SAMPLE SPACING;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0032074383     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/5/002     Document Type: Article

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