Imaging the Photoionization of Individual CdSe/CdS Core-Shell Nanocrystals on n- and p-Type Silicon Substrates with Thin Oxides

Journal of Physical Chemistry B

Volumn 108, Issue 16, 2004, Pages 4946-4961

  Cherniavskaya, Oksana ^a   Chen, Liwei ^a   Brus, Louis ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; ELECTROSTATICS; FERMI LEVEL; FLUORESCENCE; IMAGING TECHNIQUES; LUMINESCENT DEVICES; NANOSTRUCTURED MATERIALS; NATURAL FREQUENCIES; NITROGEN; PHOTOIONIZATION; POLARIZATION; SILICON;

ELECTROSTATIC FORCE MICROSCOPY; EXCITATION ENERGY; FLUCTUATING MATRIX ELEMENTS; INTERFACIAL BAND BENDING;

CADMIUM COMPOUNDS;

EID: 2342461681     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp036907b     Document Type: Article

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