Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

Materials Science and Engineering B

Volumn 51, Issue 1-3, 1998, Pages 197-201

  Leveque, G ^a   Bonnet, J ^a   Tahraoui, A ^a   Girard, P ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

Electrostatic force microscopy; Nanostructures; Surface potential

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE;

CANTILEVER FLEXURE; ELECTROSTATIC FORCE MICROSCOPY (EFM); GALLIUM ANTIMONIDE; INDIUM ARSENIDE; SURFACE TOPOGRAPHY;

NANOSTRUCTURED MATERIALS;

EID: 0343873297     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00259-6     Document Type: Article

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