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Volumn 57, Issue 7, 2008, Pages 1470-1477

A broadband CMOS amplitude detector for on-chip RF measurements

Author keywords

Amplitude detector; Built in self test (BIST); CMOS radio frequency (RF) circuits; Full wave rectifier; RF test

Indexed keywords

AMPLITUDE DETECTOR; BUILT-IN SELF-TEST (BIST); CMOS RADIO FREQUENCY (RF) CIRCUITS; FULL-WAVE RECTIFIER; RF TEST;

EID: 62949097780     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.917196     Document Type: Article
Times cited : (97)

References (37)
  • 1
    • 39749188154 scopus 로고    scopus 로고
    • Integrated RF-CMOS transceivers challenge RF test
    • F. Demmerle, "Integrated RF-CMOS transceivers challenge RF test," in Proc. IEEE Int. Test Conf., 2006, pp. 1-8.
    • (2006) Proc. IEEE Int. Test Conf , pp. 1-8
    • Demmerle, F.1
  • 2
    • 65349158244 scopus 로고    scopus 로고
    • Tech. Rep, Online, Available
    • The International Technology Roadmap for Semiconductors, 2005. Tech. Rep. [Online]. Available: http://www.itrs.net/Links/2005ITRS/ Test2005.pdf
    • (2005)
  • 4
    • 33847107533 scopus 로고    scopus 로고
    • Defect-based RF testing using a new catastrophic fault model
    • E. Acar and S. Ozev, "Defect-based RF testing using a new catastrophic fault model," in Proc. IEEE Int. Test Conf., 2005, pp. 421-429.
    • (2005) Proc. IEEE Int. Test Conf , pp. 421-429
    • Acar, E.1    Ozev, S.2
  • 5
    • 39749155128 scopus 로고    scopus 로고
    • Alternate test of RF front ends with IP constraints: Frequency domain test generation and validation
    • S. S. Akbay, J. L. Torres, J. M. Rumer, A. Chatterjee, and J. Amtsfield, "Alternate test of RF front ends with IP constraints: Frequency domain test generation and validation," in Proc. IEEE Int. Test Conf., 2006, pp. 1-10.
    • (2006) Proc. IEEE Int. Test Conf , pp. 1-10
    • Akbay, S.S.1    Torres, J.L.2    Rumer, J.M.3    Chatterjee, A.4    Amtsfield, J.5
  • 7
    • 84886537863 scopus 로고    scopus 로고
    • Built-in test of RF components using mapped feature extraction sensors
    • May
    • S. S. Akbay and A. Chatterjee, "Built-in test of RF components using mapped feature extraction sensors," in Proc. IEEE VLSI Test Symp. May 2005, pp. 243-248.
    • (2005) Proc. IEEE VLSI Test Symp , pp. 243-248
    • Akbay, S.S.1    Chatterjee, A.2
  • 8
    • 34547305524 scopus 로고    scopus 로고
    • Use of source degeneration for non-intrusive BIST of RF front-end circuits
    • A. Gopalan, T. Das, C. Washburn, and P. R. Mukund, "Use of source degeneration for non-intrusive BIST of RF front-end circuits," in Proc. IEEE Int. Symp. Circuits Syst., 2005, vol. 5, pp. 4385-4388.
    • (2005) Proc. IEEE Int. Symp. Circuits Syst , vol.5 , pp. 4385-4388
    • Gopalan, A.1    Das, T.2    Washburn, C.3    Mukund, P.R.4
  • 9
    • 33744537332 scopus 로고    scopus 로고
    • Method to measure RF transceiver bandwidth in the time domain
    • Jun
    • Q. Wang, Y. Tang, and M. Soma, "Method to measure RF transceiver bandwidth in the time domain," IEEE Trans. Instrum. Meas., vol. 55, no. 3, pp. 982-988, Jun. 2006.
    • (2006) IEEE Trans. Instrum. Meas , vol.55 , Issue.3 , pp. 982-988
    • Wang, Q.1    Tang, Y.2    Soma, M.3
  • 10
    • 4344715537 scopus 로고    scopus 로고
    • Lumped passive circuits for 5 GHz embedded test of RF SoCs
    • J. Yoon and W. R. Eisenstadt, "Lumped passive circuits for 5 GHz embedded test of RF SoCs," in Proc. IEEE Int. Symp. Circuits Syst. 2004, vol. 1, pp. 241-244.
    • (2004) Proc. IEEE Int. Symp. Circuits Syst , vol.1 , pp. 241-244
    • Yoon, J.1    Eisenstadt, W.R.2
  • 11
    • 27644593280 scopus 로고    scopus 로고
    • Embedded loopback test for RF ICs
    • Oct
    • J.-S. Yoon and W. R. Eisenstadt, "Embedded loopback test for RF ICs," IEEE Trans. Instrum. Meas., vol. 54, no. 5, pp. 1715-1720, Oct. 2005.
    • (2005) IEEE Trans. Instrum. Meas , vol.54 , Issue.5 , pp. 1715-1720
    • Yoon, J.-S.1    Eisenstadt, W.R.2
  • 12
    • 33645280088 scopus 로고    scopus 로고
    • A new low-cost RF built-in selftest measurement for system-on-chip transceivers
    • Apr
    • J.-Y. Ryu, B. C. Kim, and I. Sylla, "A new low-cost RF built-in selftest measurement for system-on-chip transceivers," IEEE Trans. Instrum. Meas., vol. 55, no. 2, pp. 381-388, Apr. 2006.
    • (2006) IEEE Trans. Instrum. Meas , vol.55 , Issue.2 , pp. 381-388
    • Ryu, J.-Y.1    Kim, B.C.2    Sylla, I.3
  • 13
    • 33748496548 scopus 로고    scopus 로고
    • An integrated frequency response characterization system with a digital interface for analog testing
    • Oct
    • A. Valdes-Garcia, F. A.-L. Hussien, J. Silva-Martinez, and E. Sánchez-Sinencio, "An integrated frequency response characterization system with a digital interface for analog testing," IEEE J. Solid-State Circuits, vol. 41, no. 10, pp. 2301-2313, Oct. 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.10 , pp. 2301-2313
    • Valdes-Garcia, A.1    Hussien, F.A.-L.2    Silva-Martinez, J.3    Sánchez-Sinencio, E.4
  • 14
    • 39749141669 scopus 로고    scopus 로고
    • 2, 2.4 GHz RF signal quality measurement macro for RF test and diagnosis
    • Jun
    • 2, 2.4 GHz RF signal quality measurement macro for RF test and diagnosis," in Proc. IEEE Symp. VLSI Circuits, Jun. 2007, pp. 212-213.
    • (2007) Proc. IEEE Symp. VLSI Circuits , pp. 212-213
    • Nose, K.1    Mizuno, M.2
  • 16
    • 0142215893 scopus 로고    scopus 로고
    • Architecting millisecond test solutions for wireless phone RFICs
    • J. Ferrario, R. Wolf, and S. Moss, "Architecting millisecond test solutions for wireless phone RFICs," in Proc. IEEE Int. Test Conf. 2003, pp. 1325-1332.
    • (2003) Proc. IEEE Int. Test Conf , pp. 1325-1332
    • Ferrario, J.1    Wolf, R.2    Moss, S.3
  • 17
    • 18144367375 scopus 로고    scopus 로고
    • Use of embedded sensors for built-in-test of RF circuits
    • S. Bhattacharya and A. Chatterjee, "Use of embedded sensors for built-in-test of RF circuits," in Proc. IEEE Int. Test Conf., 2004, pp. 801-809.
    • (2004) Proc. IEEE Int. Test Conf , pp. 801-809
    • Bhattacharya, S.1    Chatterjee, A.2
  • 18
  • 19
    • 0031649521 scopus 로고    scopus 로고
    • The multi-tanh principle: A tutorial overview
    • Jan
    • B. Gilbert, "The multi-tanh principle: A tutorial overview," IEEE J. Solid-State Circuits, vol. 33, no. 1, pp. 2-17, Jan. 1998.
    • (1998) IEEE J. Solid-State Circuits , vol.33 , Issue.1 , pp. 2-17
    • Gilbert, B.1
  • 21
    • 27644504937 scopus 로고    scopus 로고
    • A translinear RMS detector for embedded test of RF ICs
    • Oct
    • Q. Yin, W. R. Eisenstadt, R. M. Fox, and T. Zhang, "A translinear RMS detector for embedded test of RF ICs," IEEE Trans. Instrum. Meas. vol. 54, no. 5, pp. 1708-1714, Oct. 2005.
    • (2005) IEEE Trans. Instrum. Meas , vol.54 , Issue.5 , pp. 1708-1714
    • Yin, Q.1    Eisenstadt, W.R.2    Fox, R.M.3    Zhang, T.4
  • 22
    • 0029220349 scopus 로고
    • Low-power monolithic RF peak detector analysis
    • Jan
    • R. G. Meyer, "Low-power monolithic RF peak detector analysis," IEEE J. Solid-State Circuits, vol. 30, no. 1, pp. 65-67, Jan. 1995.
    • (1995) IEEE J. Solid-State Circuits , vol.30 , Issue.1 , pp. 65-67
    • Meyer, R.G.1
  • 25
    • 6444240784 scopus 로고    scopus 로고
    • RF detector for on-chip amplitude measurements
    • Jun
    • F. Jonsson and H. Olson, "RF detector for on-chip amplitude measurements," Electron. Lett., vol. 40, no. 20, pp. 1239-1240, Jun. 2004.
    • (2004) Electron. Lett , vol.40 , Issue.20 , pp. 1239-1240
    • Jonsson, F.1    Olson, H.2
  • 27
    • 33751121002 scopus 로고    scopus 로고
    • Integrated CMOS power sensors for RF BIST applications
    • May
    • H.-H. Hsieh and L.-H. Lu, "Integrated CMOS power sensors for RF BIST applications," in Proc. IEEE VLSI Test Symp., May 2006, pp. 1-5.
    • (2006) Proc. IEEE VLSI Test Symp , pp. 1-5
    • Hsieh, H.-H.1    Lu, L.-H.2
  • 28
    • 0029253566 scopus 로고
    • High-speed current mirror resistive compensation technique
    • Feb
    • T. Voo and C. Tomazou, "High-speed current mirror resistive compensation technique," Electron. Lett., vol. 31, no. 4, pp. 248-250, Feb. 1995.
    • (1995) Electron. Lett , vol.31 , Issue.4 , pp. 248-250
    • Voo, T.1    Tomazou, C.2
  • 29
    • 0026925168 scopus 로고
    • Integratable CMOS sinusoidal frequency doubler and full-wave rectifier
    • Sep
    • W. Surakampontorn and V. Riewruja, "Integratable CMOS sinusoidal frequency doubler and full-wave rectifier," Int. J. Electron., vol. 73, no. 3, pp. 627-632, Sep. 1992.
    • (1992) Int. J. Electron , vol.73 , Issue.3 , pp. 627-632
    • Surakampontorn, W.1    Riewruja, V.2
  • 30
    • 37549045661 scopus 로고    scopus 로고
    • A low-noise amplifier with integrated current and power sensors for RF BIST applications
    • May
    • Y.-C. Huang, H.-H. Hsieh, and L.-H. Lu, "A low-noise amplifier with integrated current and power sensors for RF BIST applications," in Proc. IEEE VLSI Test Symp., May 2007, pp. 401-408.
    • (2007) Proc. IEEE VLSI Test Symp , pp. 401-408
    • Huang, Y.-C.1    Hsieh, H.-H.2    Lu, L.-H.3
  • 35
    • 9144261709 scopus 로고    scopus 로고
    • P. Choi et al., An experimental coin-seized radio for extremely lowpower WPAN (IEEE 802.15.4) application at 2.4 GHz, IEEE J. Solid-State Circuits, 38, no. 12, pp. 2258-2268, Dec. 2003.
    • P. Choi et al., "An experimental coin-seized radio for extremely lowpower WPAN (IEEE 802.15.4) application at 2.4 GHz," IEEE J. Solid-State Circuits, vol. 38, no. 12, pp. 2258-2268, Dec. 2003.
  • 36
    • 8344232360 scopus 로고    scopus 로고
    • A 2.4 GHz dual-mode 0.18-μm CMOS transceiver for Bluetooth and 802.11b
    • Nov
    • T. Byunghak et al., "A 2.4 GHz dual-mode 0.18-μm CMOS transceiver for Bluetooth and 802.11b," IEEE J. Solid-State Circuits vol. 39, no. 11, pp. 1916-1926, Nov. 2004.
    • (2004) IEEE J. Solid-State Circuits , vol.39 , Issue.11 , pp. 1916-1926
    • Byunghak, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.