Architecting Millisecond Test Solutions for Wireless Phone RFIC's

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1325-1332

  Ferrario, John ^a   Wolf, Randy ^a   Moss, Steve ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETISM; INTEGRATED CIRCUIT MANUFACTURE; TESTING;

TEST SOLUTIONS;

WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 0142215893     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)