SCOPUS 정보 검색 플랫폼

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2005, Pages 4385-4388

Use of source degeneration for non-intrusive BIST of RF front-end circuits

(4) Gopalan, Anand a Das, Tejasvi a Washburn, Clyde a Mukund, P R a

a ROCHESTER INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; BIST TECHNIQUES; CASCODE; CIRCUIT UNDER TEST; CO-DESIGN; DSP CORE; LOW OVERHEAD; NON-INTRUSIVE; OFF-LINE PROCESSING; ON CHIPS; RF COMMUNICATION; RF FRONT END CIRCUITS; RF-CIRCUITS; SELF-TEST; SOURCE DEGENERATION; ULTRA-FAST;

LOW NOISE AMPLIFIERS;

BUILT-IN SELF TEST;

EID: 34547305524 PISSN: 02714310 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/ISCAS.2005.1465603 Document Type: Conference Paper

Times cited : (8)

References (6)

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2
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- Architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan
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- Heutmaker, M.S.¹ Le, D.K.²

3
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- Ferrario, J.¹ Wolf, R.² Moss, S.³ Slamani, M.⁴

4
- 2342572843
- Current sensor for on-chip non-intrusive testing of R.F systems
- January, pages
- th International conference on VLSI Deign, January 2004, pages:1023-1027
- (2004) th International conference on VLSI Deign , pp. 1023-1027
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5
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- A Non-Intrusive Self-Test Methodology for RF CMOS Low Noise Amplifiers
- June 23-25
- Anand Gopalan, P.R.Mukund and Martin Margala, "A Non-Intrusive Self-Test Methodology for RF CMOS Low Noise Amplifiers", Proceedings of IEEE Mixed Signal Test Workshop 2004, June 23-25 2004, pages 196-202
- (2004) Proceedings of IEEE Mixed Signal Test Workshop 2004 , pp. 196-202
- Gopalan, A.¹ Mukund, P.R.² Margala, M.³

6
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- An Ultra-Fast, On-chip BiST for RF Low Noise Amplifiers to be
- presented at, 03-07 Jan, Pages
- Gopalan A, Das T, Washburn C Mukund P.R. "An Ultra-Fast, On-chip BiST for RF Low Noise Amplifiers to be presented at VLSI Design 2005, 18th International Conference on , 03-07 Jan. 2005, Pages:485 - 490
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.