Integrated CMOS power sensors for RF BIST applications

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 234-238

  Hsieh, Hsieh Hung ^a   Lu, Liang Hung ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; POWER AMPLIFIERS; SENSORS;

DEVICE UNDER TEST (DUT); POWER SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 33751121002     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.40     Document Type: Conference Paper

References (3)

1. D. Lupea, U. Pursche and H.-J. Jentschel, "RF-BIST: loopback spectral signature analysis," Design, Automation and Test in Europe Conference and Exhibition, 2003, pp. 478-483.
2. M. Negreiros, L. Carro and A. A. Susin, "Low cost analogue testing of RF signal paths," Design, Automation and Test in Europe Conference and Exhibition, 2004, vol. 1, pp. 292-297.
3. D. J. Comer and D. T. Comer, "Using the weak inversion region to optimize input stage design of CMOS op amps," IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 51, no. 1, pp. 8-14, Jan. 2004