Functional vs. Multi-VDD testing of RF circuits

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 412-420

  Silva, Estella ^a   De Gyvez, José Pineda ^b   Gronthoud, Guido ^b  

^a NXP SEMICONDUCTORS   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL TESTING; PRODUCTION ENVIRONMENT; VDD;

BUILT-IN SELF TEST; CORRELATION METHODS; TRANSCEIVERS;

DIGITAL CIRCUITS;

EID: 33847097160     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584000     Document Type: Conference Paper

References (11)

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