Alternate test of RF front ends with IP constraints: Frequency domain test generation and validation

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Akbay, S Sermet ^a   Torres, José L ^b   Rumer, Julie M ^b   Chatterjee, Abhijit ^a   Amtsfield, Joel ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; INFORMATION ANALYSIS; MICROPROCESSOR CHIPS; NETWORKS (CIRCUITS); PARAMETER ESTIMATION;

DATASHEET INFORMATION; DATASHEET SPECIFICATIONS; RF CIRCUITS; TESTER COMPLEXITY;

CONSTRAINT THEORY;

EID: 39749155128     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297706     Document Type: Conference Paper

References (28)