A new low-cost RF built-in self-test measurement for system-on-chip transceivers

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 2, 2006, Pages 381-388

  Ryu, Jee Youl ^a   Kim, Bruce C ^b   Sylla, Iboun ^c  

^a Samsung SDI   (South Korea)

^b The Aerospace Engineering and Mechanics Department   (United States)

^c TEXAS INSTRUMENTS   (United States)

Author keywords

Automatic compensation network (ACN); Built in self test (BIST); Low noise amplifier (LNA); System on chip (SoC)

Indexed keywords

BUILT-IN SELF TEST; INTEGRATED CIRCUIT TESTING; RADIO FREQUENCY AMPLIFIERS; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL TO NOISE RATIO; VOLTAGE MEASUREMENT; VOLTMETERS;

AUTOMATIC COMPENSATION NETWORK (ACN); LOW NOISE AMPLIFIER (LNA); SYSTEM-ON-CHIP (SOC);

TRANSCEIVERS;

EID: 33645280088     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.870317     Document Type: Article

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