On-chip testing techniques for RF wireless transceivers

IEEE Design and Test of Computers

Volumn 23, Issue 4, 2006, Pages 268-277

  Valdes Garcia, Alberto ^a   Silva Martinez, Jose ^b   Sánchez Sinencio, Edgar ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Texas AandM University   (United States)

^c TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS;

ON-CHIP TESTING TECHNIQUES; WIRELESS RADIO FREQUENCY TRANSCEIVERS;

TRANSCEIVERS;

EID: 33748493782     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.100     Document Type: Article

References (14)

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