Bipolar microwave RMS power detectors

IEEE Journal of Solid-State Circuits

Volumn 41, Issue 9, 2006, Pages 2188-2192

  Zhang, Tao ^a,b,c   Eisenstadt, William R ^a,b   Fox, Robert M ^a,b   Yin, Qizhang ^a,b,d  

^a IEEE   (United States)

^b University of Florida   (United States)

^c MARVELL SEMICONDUCTOR INC   (United States)

^d Monolithic Power Systems   (United States)

Author keywords

Bipolar; Bipolar transistor; Built in self test; Detector; Embedded test; Peak; Peak detector; Power; RMS; RMS power detector

Indexed keywords

EMBEDDED TEST; PEAK DETECTOR; RFIC TEST; RMS POWER DETECTOR;

BIPOLAR TRANSISTORS; BUILT-IN SELF TEST; DIODES; ELECTRIC ATTENUATORS; MICROWAVE DEVICES;

DETECTORS;

EID: 33748366382     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2006.880592     Document Type: Conference Paper

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