Embedded loopback test for RF ICs

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 5, 2005, Pages 1715-1720

  Yoon, Jang Sup ^a   Eisenstadt, William R ^a  

^a University of Florida   (United States)

Author keywords

Loopback; Measurements; On chip; Radio frequancy (RF); Test; Transceiver; Wireless local area network (WLAN)

Indexed keywords

DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; LOCAL AREA NETWORKS; TRANSCEIVERS; WIRELESS TELECOMMUNICATION SYSTEMS;

LOOPBACK TEST; TRANSCEIVER LOOPBACK MEASUREMENTS; WIRELESS LOCAL AREA NETWORK;

INTEGRATED CIRCUIT TESTING;

EID: 27644593280     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.855091     Document Type: Article

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