Use of embedded sensors for built-in-test of RF circuits

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 801-809

  Bhattacharya, Soumendu ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DC SIGNALS; DEVICE UNDER TEST (DUT); EMBEDDED SENSORS; RF CIRCUITS;

ALGORITHMS; BUILT-IN SELF TEST; EMBEDDED SYSTEMS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SENSORS; SIGNAL PROCESSING;

MICROWAVE CIRCUITS;

EID: 18144367375     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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