Defect-based RF testing using a new catastrophic fault model

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 421-429

  Acar, Erkan ^a   Ozev, Sule ^a  

^a DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG DOMAIN; DEFECT-BASED TESTING; DETECTABILITY INFORMATION; RF SYSTEMS;

ANALOG COMPUTERS; AUTOMATIC TESTING; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SPECIFICATIONS;

RADIO SYSTEMS;

EID: 33847107533     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584001     Document Type: Conference Paper

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