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Volumn 105, Issue 3, 2009, Pages

Accumulation of fluorine in C F4 plasma-treated AlGaNGaN heterostructure interface: An experimental investigation

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON GAS; FLUORINE; GALVANOMAGNETIC EFFECTS; HALL EFFECT; HALL MOBILITY; HETEROJUNCTIONS; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; MAGNETIC FIELD EFFECTS; MASS SPECTROMETRY; PLASMA APPLICATIONS; PLASMAS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SECONDARY ION MASS SPECTROMETRY; TRANSPORT PROPERTIES;

EID: 60449117932     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3074514     Document Type: Article
Times cited : (18)

References (31)
  • 29
    • 60449097997 scopus 로고
    • in, edited by S. T. Pantelides (Gordon and Breach, New York),.
    • G. D. Watkins, in Radiation Damage in Semiconductors, edited by, S. T. Pantelides, (Gordon and Breach, New York, 1986), p. 147.
    • (1986) Radiation Damage in Semiconductors , pp. 147
    • Watkins, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.