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Volumn 78, Issue 20, 2001, Pages 3088-3090

Effect of growth termination conditions on the performance of AlGaN/GaN high electron mobility transistors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0347768415     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1372620     Document Type: Article
Times cited : (20)

References (16)
  • 1
    • 0347451868 scopus 로고    scopus 로고
    • Compd. Semicond. 6, 1 (2000); Y.-F. Wu, D. Kapolnek, J. P. Ibbetson, P. Parikh, B. P. Keller, and U. K. Mishra, 2000 IEEE MTT-S International Microwave Symposium, Boston, MA June, 2000, Piscataway. NJ [IEEE MTT-S Int. Microwave Symp. Dig. 963 (2000)].
    • (2000) Compd. Semicond. , vol.6 , pp. 1
  • 3
    • 0346190665 scopus 로고    scopus 로고
    • Compd. Semicond. 6, 1 (2000); Y.-F. Wu, D. Kapolnek, J. P. Ibbetson, P. Parikh, B. P. Keller, and U. K. Mishra, 2000 IEEE MTT-S International Microwave Symposium, Boston, MA June, 2000, Piscataway. NJ [IEEE MTT-S Int. Microwave Symp. Dig. 963 (2000)].
    • (2000) IEEE MTT-S Int. Microwave Symp. Dig. , vol.963
  • 5
    • 0347451860 scopus 로고    scopus 로고
    • note
    • The generally lower power values observed on sapphire results from the severe heating of the devices due to the low thermal conductivity of the sapphire substrate compared to SiC without further thermal management.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.