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Volumn 255, Issue 8, 2009, Pages 4664-4669

Dose and pressure dependence of silicon microstructure in SF 6 gas due to excimer laser irradiation

Author keywords

ArF laser; Resonance pattern; Si microstructure; Surface wave

Indexed keywords

EXCIMER LASERS; FLUID MECHANICS; HEAT TRANSFER; LASER BEAM EFFECTS; MICROSTRUCTURE; SULFUR HEXAFLUORIDE; SURFACE WAVES;

EID: 58349095768     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.12.024     Document Type: Article
Times cited : (18)

References (30)
  • 30
    • 58349084027 scopus 로고    scopus 로고
    • P.Enghag, Eneyclopedia of the elements, Wiley-VcH Verlag GmbH & Co. KGaA, 2004.
    • P.Enghag, Eneyclopedia of the elements, Wiley-VcH Verlag GmbH & Co. KGaA, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.