Degeneracy and instability of nanocontacts between conductive tips and hydrogenated nanocrystalline Si surfaces in conductive atomic force microscopy

Nanotechnology

Volumn 20, Issue 4, 2009, Pages

  Cavalcoli, Daniela ^c   Rossi, Marco ^a   Tomasi, Andrea ^b   Cavallini, Anna ^c  

^a ESTELUX Srl   (Italy)

^b X Group SPA   (Italy)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; CONDUCTIVE MATERIALS; ELECTRIC FIELDS; ELECTRIC PROPERTIES; FLOW INTERACTIONS; MATERIALS PROPERTIES; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; OPTICAL PROJECTORS; SEMICONDUCTING SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; SURFACES;

COATING CHARACTERISTICS; CONDUCTIVE ATOMIC FORCE MICROSCOPIES; CONDUCTIVE TIPS; ELECTRICAL CURRENTS; ELECTRICAL INTERACTIONS; ELECTRICAL PROPERTIES; LOAD CONDITIONS; MEASUREMENT ARTIFACTS; MULTIPHASE MATERIALS; NANO CONTACTS; NANOCRYSTALLINE; NANOSCALE; SAMPLE SURFACES; SI SURFACES; SIGNIFICANT DETERIORATIONS; STRONG ELECTRIC FIELDS;

CONDUCTIVE FILMS;

NANOCONTACT; NANOCRYSTALLINE; NANOMATERIAL; SILICON; UNCLASSIFIED DRUG;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CONDUCTIVE TIP; ELECTRIC CURRENT; ELECTRIC FIELD; ELECTRIC POTENTIAL; FILM; MEASUREMENT; MEDICAL INSTRUMENTATION; PRIORITY JOURNAL; SAMPLE;

EID: 58149271088     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/4/045702     Document Type: Article

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