Conducting-tip atomic force microscopy for injection and probing of localized charges in silicon nanocrystals

Applied Physics Letters

Volumn 83, Issue 18, 2003, Pages 3788-3790

  Banerjee, Souri ^a   Salem, Mohamed Ali ^a   Oda, Shunri ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; DECOMPOSITION; ELECTRON TRANSPORT PROPERTIES; HIGH RESOLUTION ELECTRON MICROSCOPY; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NUMERICAL ANALYSIS; OXIDATION; PLASMA APPLICATIONS; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

CHARGE INJECTION; NONCONTACT-MODE TOPOGRAPHY IMAGING; PLASMA DECOMPOSITION; SILICON NANOCRYSTAL;

SEMICONDUCTING SILICON;

EID: 0344497389     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1624469     Document Type: Article

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