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Solid State Phenomena

Volumn 131-133, Issue , 2008, Pages 547-552

Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy

(6) Cavalcoli, D a Rossi, M a,c Tomasi, A a,d Cavallini, A a Chrastina, D b Isella, G b

a UNIVERSITY OF BOLOGNA (Italy)

b L NESS (Italy)

c ESTELUX Srl (Italy)

d X Group SPA (Italy)

Author keywords

Atomic force microscopy; Nanocrystallinsilicon; Solar cells

Indexed keywords

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; NANOCRYSTALLINE SILICON; SOLAR CELLS; DEFECTS; ELECTRONIC PROPERTIES; HYDROGENATION; NANOCRYSTALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICE MANUFACTURE;

CONDUCTION MECHANISM; CURRENT FLOW; PHOTOVOLTAIC APPLICATIONS; CONDUCTIVE AFM; HIGH SPATIAL RESOLUTION; HYDROGENATED NANOCRYSTALLINE SILICON; HYDROGENATED NANOCRYSTALLINE SILICON THIN FILM; MORPHOLOGICAL PROPERTIES; NANOCRYSTALLINSILICON;

THIN FILMS; NANOCRYSTALLINE SILICON;

EID: 38549134382 PISSN: 10120394 EISSN: None Source Type: Book Series
DOI: None Document Type: Conference Paper

Times cited : (2)

References (8)

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- S. Pizzini, M. Acciarri, S. Binetti, D. Cavalcoli, A. Cavallini, D. Chrastina, L. Colombo, E. Grilli, G. Isella, M. Lancin, A. Le Donne, A. Mattoni, K. Peter, B. Pichaud, E. Poliani, M. Rossi, S. Sanguinetti, M. Texier, H. von Känel, Mater. Sci. Eng. B 134 (2006) 118.
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- in press
- M. Texier, M. Acciarri, S. Binetti, D. Cavalcoli, A. Cavallini, D. Chrastina, G. Isella, M. Lancin, A. Tomasi, B. Pichaud, S. Pizzini, M. Rossi, Microscopy of Semiconducting Materials, 2007 in press.
- (2007) Microscopy of Semiconducting Materials
- Texier, M.¹ Acciarri, M.² Binetti, S.³ Cavalcoli, D.⁴ Cavallini, A.⁵ Chrastina, D.⁶ Isella, G.⁷ Lancin, M.⁸ Tomasi, A.⁹ Pichaud, B.¹⁰ Pizzini, S.¹¹ Rossi, M.¹²

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.