Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks

Optics Express

Volumn 14, Issue 10, 2006, Pages 4452-4458

  Lin, Shih Kai ^a   Lin, I Chun ^a   Tsai, Din Ping ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; IMAGE PROCESSING; OPTICAL PROPERTIES; PHASE SHIFT; THERMAL CONDUCTIVITY;

DIFFRACTION LIMIT; DIGITAL VERSATILE DISK; PHASE-CHANGE RECORDING;

OPTICAL MATERIALS;

EID: 33646581692     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.004452     Document Type: Article

References (16)

1. T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39, 770-774 (2000).
2. R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43, 4799-4800 (2004).
3. Blu-ray disk 23GB, SONY, 6-7-35 Kitashinagawa, Shinagawa-ku, Tokyo 141-0001, Japan.
4. J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73, 2078-2080 (1998).
5. T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89, 6139-6145 (2001).
6. D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77, 1413-1415 (2000).
7. W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78, 685-687 (2001).
8. 2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003).
9. T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39, 3599-3602 (2000).
10. T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7, 363-367 (2001).
11. T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38, 1698-1700 (1999).
12. M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4, 826-831 (1998).
13. 5," J. Appl. Phys. 95, 924-932 (2004).
14. 4X DVD+RW for data and video 4.7GB 120min, RITEK, 42, Kuan-Fu N. Road, Hsin-Chu Industrial Park, 30316, Taiwan.
15. C. Peng, Lu Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82, 4183-4191 (1999).
16. E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91, 9794-9802 (2002).