The radial distribution of defects in a percolation path

Applied Physics Letters

Volumn 93, Issue 26, 2008, Pages

  Li, X ^a,b   Tung, C H ^b   Pey, K L ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; OXYGEN; OXYGEN VACANCIES; PERCOLATION (FLUIDS); SILICON COMPOUNDS; SOLVENTS;

COMPOSITION CHANGES; CONDUCTION BAND EDGES; DEFECT DISTRIBUTIONS; DEFECTIVE OXIDES; NANOMETER SIZES; NON UNIFORMS; PERCOLATION PATHS; RADIAL DISTRIBUTIONS;

THERMAL NOISE;

EID: 58149236521     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3056659     Document Type: Article

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