메뉴 건너뛰기




Volumn 99, Issue 8, 2006, Pages

Extended Mie-Grüneisen molecular model for time dependent dielectric breakdown in silica detailing the critical roles of O-Si O3 tetragonal bonding, stretched bonds, hole capture, and hydrogen release

Author keywords

[No Author keywords available]

Indexed keywords

BOND BREAKAGE; EFFECTIVE DIPOLE-MOMENT; TIME DEPENDENT DIELECTRIC BREAKDOWN (TDDB); ZERO-FIELD ACTIVATION ENERGY;

EID: 33646722449     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2189930     Document Type: Article
Times cited : (31)

References (43)
  • 1
    • 33646732359 scopus 로고    scopus 로고
    • International Reliability Physics Proceedings (IEEE, Piscataway, NJ
    • B. Schlund, International Reliability Physics Proceedings (IEEE, Piscataway, NJ, 1996), p. 84.
    • (1996) , pp. 84
    • Schlund, B.1
  • 13
  • 14
    • 0003998388 scopus 로고    scopus 로고
    • 81st ed., edited by D.Lide (CRC, NY
    • Handbook of Chemistry and Physics, 81st ed., edited by, D. Lide, (CRC, NY, 2000), pp. 5-22.
    • (2000) Handbook of Chemistry and Physics , pp. 5-22
  • 15
    • 0003516749 scopus 로고    scopus 로고
    • 5th ed. (Freeman, San Francisco
    • P. Atkins, Physical Chemistry, 5th ed. (Freeman, San Francisco, 1996), C7.
    • (1996) Physical Chemistry
    • Atkins, P.1
  • 22
    • 0003470014 scopus 로고
    • Harcourt Brace College, Orlando, FL
    • N. Ashcroft and D. Mermin, Solid State Physics (Harcourt Brace College, Orlando, FL, 1976). pp. 395-414.
    • (1976) Solid State Physics , pp. 395-414
    • Ashcroft, N.1    Mermin, D.2
  • 26
    • 84964662518 scopus 로고    scopus 로고
    • edited by D.Dumin (World Scientific, Singapore
    • J. McPherson, Oxide Reliability, edited by, D. Dumin, (World Scientific, Singapore, 2002), pp. 135-171; Int. J. High Speed Electron. Syst. 11, 751 (2001).
    • (2002) Oxide Reliability , pp. 135-171
    • McPherson, J.1
  • 27
    • 31144466867 scopus 로고    scopus 로고
    • J. McPherson, Oxide Reliability, edited by, D. Dumin, (World Scientific, Singapore, 2002), pp. 135-171; Int. J. High Speed Electron. Syst. 11, 751 (2001).
    • (2001) Int. J. High Speed Electron. Syst. , vol.11 , pp. 751
  • 31
    • 84964662518 scopus 로고    scopus 로고
    • edited by D.Dumin (World Scientific, Singapore
    • J. Sune, D. Jimenez, and E. Miranda, Oxide Reliability, edited by, D. Dumin, (World Scientific, Singapore, 2002) pp. 135-171; Int. J. High Speed Electron. Syst. 11, 789 (2001).
    • (2002) Oxide Reliability , pp. 135-171
    • Sune, J.1    Jimenez, D.2    Miranda, E.3
  • 32
    • 0038523401 scopus 로고    scopus 로고
    • J. Sune, D. Jimenez, and E. Miranda, Oxide Reliability, edited by, D. Dumin, (World Scientific, Singapore, 2002) pp. 135-171; Int. J. High Speed Electron. Syst. 11, 789 (2001).
    • (2001) Int. J. High Speed Electron. Syst. , vol.11 , pp. 789


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.