Probing the electronic structure of defective oxide: An EELS approach

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 692-695

  Li, X ^a,b   Zhang, G ^b   Tung, C H ^b   Pey, K L ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTIVE OXIDES; MATERIAL PROPERTY; OXYGEN DEFICIENT; STATE-OF-THE-ART DEVICES;

ELECTRONIC PROPERTIES; OXYGEN; OXYGEN VACANCIES;

ELECTRONIC STRUCTURE;

EID: 70449099254     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173331     Document Type: Conference Paper

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8. E. D. Palik, Handbook of Optical Constants (Academic, Orlando, 1998).
9. L. A. J. Garvie et al., Am. Mineral. 85, 732 (2000).