Measuring the dielectric constant of materials from valence EELS

Micron

Volumn 40, Issue 2, 2009, Pages 262-268

  Potapov, P L ^a   Engelmann, H J ^a   Zschech, E ^a   Stoger Pollach M ^b  

^a IBM MICROELECTRONICS   (United States)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Cherenkov effect; Dielectric constant; Dielectric properties; High resolution EELS; Kramers Kronig transformation; Optical properties; Relativistic losses; Valence EELS; VEELS

Indexed keywords

CERAMIC CAPACITORS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIELECTRIC WAVEGUIDES; OPTICAL PROPERTIES; PERMITTIVITY; WATER POLLUTION;

CHERENKOV EFFECT; DIELECTRIC CONSTANT; HIGH-RESOLUTION EELS; KRAMERS-KRONIG TRANSFORMATION; RELATIVISTIC LOSSES; VALENCE EELS; VEELS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 56949087180     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2008.07.006     Document Type: Article

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