A 150 MS/s 133 μw 7 bit ADC in 90 nm digital CMOS

IEEE Journal of Solid-State Circuits

Volumn 43, Issue 12, 2008, Pages 2631-2640

  Van Der Plas, Geert ^a   Verbruggen, Bob ^a  

^a IMEC   (Belgium)

Author keywords

Analog digital conversion; Calibration; CMOS; Comparators; Flash; SAR

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CALIBRATION; COMPARATORS (OPTICAL); DIGITAL TO ANALOG CONVERSION; ELECTRIC CONVERTERS; SECURITY OF DATA; SOFTWARE PROTOTYPING; SYNTHETIC APERTURES;

ANALOG-DIGITAL CONVERSION; CMOS; COMPARATORS; FLASH; SAR;

ENERGY EFFICIENCY;

EID: 57849122188     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2008.2006315     Document Type: Conference Paper

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